Mettler-Toledo Product Inspection announced the release of the X52 Dual Energy x-ray inspection system to complete its X2 Series. Designed to meet the demands of challenging applications in packaged products, the X52’s proprietary software transitions between single energy, dual energy or both modes.
The X52 system is being demonstrated at Pack Expo in booth S-2939 in Chicago, Nov. 3-6.
In single energy mode, the X52 identifies a wide range of contaminants including glass, metal, mineral stone, calcified bone, dense plastic and rubber compounds based on their material composition, offering inspection for product safety and quality. Dual energy mode analyzes materials' densities, providing an advanced level of detection to preserve consumer well-being and uphold industry standards, said Mettler Toledo.
The X52 reduces false rejects, said the company, distinguishing between genuine contaminants and product variations. It offers increased sensitivity, thanks to its use of proprietary Advanced Material Discrimination (AMD) and ContamPlus software, said Mettler Toledo. The AMD dual energy software enhances the system's ability to differentiate between materials, offering contaminant detection even in challenging scenarios such as products that are overlapping or vary in thickness. The HiGain+ DE detector provides sensitivity and resolution, enhancing material analysis.
“The X52 x-ray inspection system marks a pivotal leap forward in product inspection technology," said Mike Pipe, head of global sales and product management at Mettler Toledo Safeline X-ray. "With its forward-thinking design, the X52 future-proofs manufacturers by detecting unwanted contaminants in even the most challenging packages. Its unmatched performance, innovative features and comprehensive support set a new standard for product integrity and reliability. We are thrilled to provide manufacturers with the tools they need for enhanced product safety, quality and compliance now and in the future."
For more information about the X52 x-ray inspection system, click here.
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